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BiBTeX citation export for WE1C2: An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction

  author       = {N. Samadi and G. Lovric and C. Ozkan Loch and X. Shi},
  title        = {{An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction}},
& booktitle    = {Proc. IBIC'22},
  booktitle    = {Proc. 11th Int. Beam Instrum. Conf. (IBIC'22)},
  pages        = {366--369},
  eid          = {WE1C2},
  language     = {english},
  keywords     = {synchrotron, simulation, experiment, emittance, undulator},
  venue        = {Kraków, Poland},
  series       = {International Beam Instrumentation Conference},
  number       = {11},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {12},
  year         = {2022},
  issn         = {2673-5350},
  isbn         = {978-3-95450-241-7},
  doi          = {10.18429/JACoW-IBIC2022-WE1C2},
  url          = {https://jacow.org/ibic2022/papers/we1c2.pdf},
  abstract     = {{The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources.}},