JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
@inproceedings{samadi:ibic2022-we1c2,
author = {N. Samadi and G. Lovric and C. Ozkan Loch and X. Shi},
title = {{An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction}},
& booktitle = {Proc. IBIC'22},
booktitle = {Proc. 11th Int. Beam Instrum. Conf. (IBIC'22)},
pages = {366--369},
eid = {WE1C2},
language = {english},
keywords = {synchrotron, simulation, experiment, emittance, undulator},
venue = {Kraków, Poland},
series = {International Beam Instrumentation Conference},
number = {11},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {12},
year = {2022},
issn = {2673-5350},
isbn = {978-3-95450-241-7},
doi = {10.18429/JACoW-IBIC2022-WE1C2},
url = {https://jacow.org/ibic2022/papers/we1c2.pdf},
abstract = {{The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources.}},
}