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BiBTeX citation export for TUP20: Correction for Systematic Errors in Transverse Phase Space Measurements at PITZ

@inproceedings{richard:ibic2022-tup20,
  author       = {C.J. Richard and Z. Aboulbanine and G.D. Adhikari and N. Aftab and P. Boonpornprasert and G.Z. Georgiev and M. Groß and A. Hoffmann and M. Krasilnikov and X.-K. Li and A. Lueangaramwong and R. Niemczyk and H.J. Qian and F. Stephan and G. Vashchenko and T. Weilbach},
% author       = {C.J. Richard and Z. Aboulbanine and G.D. Adhikari and N. Aftab and P. Boonpornprasert and G.Z. Georgiev and others},
% author       = {C.J. Richard and others},
  title        = {{Correction for Systematic Errors in Transverse Phase Space Measurements at PITZ}},
& booktitle    = {Proc. IBIC'22},
  booktitle    = {Proc. 11th Int. Beam Instrum. Conf. (IBIC'22)},
  pages        = {273--276},
  eid          = {TUP20},
  language     = {english},
  keywords     = {emittance, electron, FEL, solenoid, gun},
  venue        = {Kraków, Poland},
  series       = {International Beam Instrumentation Conference},
  number       = {11},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {12},
  year         = {2022},
  issn         = {2673-5350},
  isbn         = {978-3-95450-241-7},
  doi          = {10.18429/JACoW-IBIC2022-TUP20},
  url          = {https://jacow.org/ibic2022/papers/tup20.pdf},
  abstract     = {{The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. AT PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.}},
}