JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
TY - CONF AU - Samadi, N. AU - Lovric, G. AU - Ozkan Loch, C. AU - Shi, X. ED - Forck, Peter ED - Wawrzyniak, Adriana ED - Schaa, Volker R.W. ED - Kowalski, Grzegorz W. ED - Cudek, Agnieszka (SOLARIS, Kraków TI - An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction J2 - Proc. of IBIC2022, Kraków, Poland, 11-15 September 2022 CY - Kraków, Poland T2 - International Beam Instrumentation Conference T3 - 11 LA - english AB - The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources. PB - JACoW Publishing CP - Geneva, Switzerland SP - 366 EP - 369 KW - synchrotron KW - simulation KW - experiment KW - emittance KW - undulator DA - 2022/12 PY - 2022 SN - 2673-5350 SN - 978-3-95450-241-7 DO - doi:10.18429/JACoW-IBIC2022-WE1C2 UR - https://jacow.org/ibic2022/papers/we1c2.pdf ER -